5XMM J152559.3+514230

5XMM-DR15 stacked source · SRCID 3001183020100005
Position: 15h25m59.39s +51d42m30.2s (231.49747°, 51.70838°)
EP flux
4.10e-14 ± 6.1e-15 erg cm-2 s-1
CLASSX
AGN (0.942)
Detections
3

SRCID 3001183020100005
IAUNAME 5XMM J152559.3+514230
SC_RA 15h25m59.39s (231.49747°)
SC_DEC +51d42m30.2s (51.70838°)
RADEC_ERR 0.40 arcsec
LII / BII 83.9327° / 52.0607°
N_CONTRIB 3 (detections)
N_OBS 3 (observations covering the position)
MJD_FIRST 52120.591 (2001-07-30 14:11:33.000 UTC)
MJD_LAST 52256.395 (2001-12-13 09:28:36.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 4.10e-14 ± 6.1e-15 erg cm-2 s-1

Hardness ratios
HR1
0.12 ± 0.07
0.2-0.5 / 0.5-1.0 keV
HR2
-0.03 ± 0.07
0.5-1.0 / 1.0-2.0 keV
HR3
-0.37 ± 0.08
1.0-2.0 / 2.0-4.5 keV
HR4
-0.45 ± 0.17
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -2.9) SUM_FLAG: 0
Long-term lightcurve

AGN

CLASSX outlier: -0.0889

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
3926212
Match probability
0.998
FilterMag (AB)Err
UVW2
UVM2
UVW1 21.872 0.206
U
B
V

Photometric (TPZ) 1.1257 (conf 0.81)
Photometric (Le Phare) 1.0070 (conf 0.81)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 3.26e-14 (+3.9e-14 / −2.7e-14) erg cm−2 s−1
NH 1.69e+20 (+5.8e+20 / −2.4e+19) cm−2
Photon index (Γ) 1.88 (+2.13 / −1.72)
DoF 515
p-value 0.395
Inter-instrument norm. 0.83 (0.68–1.01)
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.