5XMM J152640.6+513355

5XMM-DR15 stacked source · SRCID 3001183020100008
Position: 15h26m40.64s +51d33m55.5s (231.66935°, 51.56542°)
EP flux
2.75e-14 ± 6.6e-15 erg cm-2 s-1
CLASSX
AGN (0.881)
Detections
3

SRCID 3001183020100008
IAUNAME 5XMM J152640.6+513355
SC_RA 15h26m40.64s (231.66935°)
SC_DEC +51d33m55.5s (51.56542°)
RADEC_ERR 0.54 arcsec
LII / BII 83.6486° / 52.0249°
N_CONTRIB 3 (detections)
N_OBS 3 (observations covering the position)
MJD_FIRST 52120.591 (2001-07-30 14:11:33.000 UTC)
MJD_LAST 52256.395 (2001-12-13 09:28:36.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 2.75e-14 ± 6.6e-15 erg cm-2 s-1

Hardness ratios
HR1
-0.02 ± 0.07
0.2-0.5 / 0.5-1.0 keV
HR2
-0.28 ± 0.08
0.5-1.0 / 1.0-2.0 keV
HR3
-0.42 ± 0.12
1.0-2.0 / 2.0-4.5 keV
HR4
-0.48 ± 0.40
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -2.1) SUM_FLAG: 0
Long-term lightcurve

AGN

CLASSX outlier: -0.485

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
3927384
Match probability
0.999
FilterMag (AB)Err
UVW2
UVM2 20.487 0.230
UVW1 20.538 0.051
U
B
V

Photometric (TPZ) 0.2759 (conf 0.75)
Photometric (Le Phare) 0.3223 (conf 0.98)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 1.75e-14 (+2.1e-14 / −1.4e-14) erg cm−2 s−1
NH 4.57e+19 (+1.9e+20 / −1.5e+19) cm−2
Photon index (Γ) 2.36 (+2.59 / −2.18)
DoF 410
p-value 0.591
Inter-instrument norm. 1.59 (1.33–1.83)
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.