5XMM J105225.2+572246

5XMM-DR15 stacked source · SRCID 3002274010100154
Position: 10h52m25.23s +57d22m46.8s (163.10511°, 57.37967°)
EP flux
3.64e-15 ± 7.2e-16 erg cm-2 s-1
CLASSX
AGN (0.8)
Detections
17

SRCID 3002274010100154
IAUNAME 5XMM J105225.2+572246
SC_RA 10h52m25.23s (163.10511°)
SC_DEC +57d22m46.8s (57.37967°)
RADEC_ERR 0.36 arcsec
LII / BII 149.4482° / 53.1847°
N_CONTRIB 17 (detections)
N_OBS 21 (observations covering the position)
MJD_FIRST 51661.158 (2000-04-27 03:47:47.000 UTC)
MJD_LAST 52615.196 (2002-12-07 04:41:59.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 3.64e-15 ± 7.2e-16 erg cm-2 s-1

Hardness ratios
HR1
0.07 ± 0.07
0.2-0.5 / 0.5-1.0 keV
HR2
-0.31 ± 0.08
0.5-1.0 / 1.0-2.0 keV
HR3
-0.23 ± 0.11
1.0-2.0 / 2.0-4.5 keV
HR4
-0.34 ± 0.24
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -2.6) SUM_FLAG: 1
Long-term lightcurve

AGN

CLASSX outlier: -0.164

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
2956148
Match probability
0.996
FilterMag (AB)Err
UVW2
UVM2
UVW1 22.402 0.081
U 22.197 0.065
B 22.036 0.099
V

Spectroscopic (zsp) 0.80700
Photometric (TPZ) 1.5256 (conf 0.37)
Photometric (Le Phare) 0.5953 (conf 0.71)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 5.11e-15 (+6.4e-15 / −4.1e-15) erg cm−2 s−1
NH 6.77e+19 (+2.7e+20 / −1.9e+19) cm−2
Photon index (Γ) 2.72 (+2.92 / −2.46)
DoF 103
p-value 0.654
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.