5XMM J083753.6+254655

5XMM-DR15 stacked source · SRCID 3002554030100010
Position: 08h37m53.65s +25d46m55.8s (129.47355°, 25.78215°)
EP flux
9.61e-14 ± 1.6e-14 erg cm-2 s-1
CLASSX
AGN (0.899)
Detections
1

SRCID 3002554030100010
IAUNAME 5XMM J083753.6+254655
SC_RA 08h37m53.65s (129.47355°)
SC_DEC +25d46m55.8s (25.78215°)
RADEC_ERR 0.60 arcsec
LII / BII 198.7683° / 33.8719°
N_CONTRIB 1 (detections)
N_OBS 2 (observations covering the position)
MJD_FIRST 52026.319 (2001-04-27 07:38:53.000 UTC)
MJD_LAST 52026.458 (2001-04-27 10:59:04.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 9.61e-14 ± 1.6e-14 erg cm-2 s-1

Hardness ratios
HR1
0.06 ± 0.09
0.2-0.5 / 0.5-1.0 keV
HR2
-0.15 ± 0.09
0.5-1.0 / 1.0-2.0 keV
HR3
-0.13 ± 0.11
1.0-2.0 / 2.0-4.5 keV
HR4
-0.47 ± 0.15
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -2.8) SUM_FLAG: 0
Long-term lightcurve

AGN

CLASSX outlier: -0.371

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
2599755
Match probability
0.999
FilterMag (AB)Err
UVW2
UVM2
UVW1
U 21.025 0.169
B
V

Photometric (TPZ) 0.2759 (conf 0.75)
Photometric (Le Phare) 0.2937 (conf 1.00)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 1.08e-13 (+1.2e-13 / −9.3e-14) erg cm−2 s−1
NH 3.49e+19 (+1.2e+20 / −1.5e+19) cm−2
Photon index (Γ) 1.85 (+1.99 / −1.73)
DoF 257
p-value 0.816
Inter-instrument norm. 0.88 (0.74–1.02)
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.