5XMM J101850.4+412202

5XMM-DR15 stacked source · SRCID 3002874030100037
Position: 10h18m50.47s +41d22m02.9s (154.71028°, 41.36747°)
EP flux
1.49e-14 ± 3.9e-15 erg cm-2 s-1
CLASSX
AGN (0.912)
Detections
1

SRCID 3002874030100037
IAUNAME 5XMM J101850.4+412202
SC_RA 10h18m50.47s (154.71028°)
SC_DEC +41d22m02.9s (41.36747°)
RADEC_ERR 0.89 arcsec
LII / BII 178.3939° / 55.7523°
N_CONTRIB 1 (detections)
N_OBS 1 (observations covering the position)
MJD_FIRST 52215.969 (2001-11-02 23:15:02.000 UTC)
MJD_LAST 52216.312 (2001-11-03 07:28:39.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 1.49e-14 ± 3.9e-15 erg cm-2 s-1

Hardness ratios
HR1
-0.10 ± 0.16
0.2-0.5 / 0.5-1.0 keV
HR2
0.20 ± 0.15
0.5-1.0 / 1.0-2.0 keV
HR3
-0.40 ± 0.16
1.0-2.0 / 2.0-4.5 keV
HR4
-0.17 ± 0.25
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -1.9) SUM_FLAG: 0
Long-term lightcurve

AGN

CLASSX outlier: -0.57

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
2865775
Match probability
0.962
FilterMag (AB)Err
UVW2
UVM2
UVW1
U 21.855 0.346
B
V 20.342 0.385

Spectroscopic (zsp) 0.23800
Photometric (TPZ) 0.1760 (conf 0.53)
Photometric (Le Phare) 0.3898 (conf 0.98)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 6.19e-15 (+9.4e-15 / −4.0e-15) erg cm−2 s−1
NH 7.61e+19 (+4.2e+20 / −1.8e+19) cm−2
Photon index (Γ) 2.22 (+2.61 / −1.79)
DoF 111
p-value 0.823
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.