5XMM J230444.9+031145

5XMM-DR15 stacked source · SRCID 3003354100100001
Position: 23h04m44.97s +03d11m45.8s (346.18736°, 3.19605°)
EP flux
6.16e-13 ± 1.8e-14 erg cm-2 s-1
CLASSX
AGN (0.928)
Detections
1

SRCID 3003354100100001
IAUNAME 5XMM J230444.9+031145
SC_RA 23h04m44.97s (346.18736°)
SC_DEC +03d11m45.8s (3.19605°)
RADEC_ERR 0.14 arcsec
LII / BII 78.4552° / -50.2306°
N_CONTRIB 1 (detections)
N_OBS 1 (observations covering the position)
MJD_FIRST 52242.909 (2001-11-29 21:49:15.000 UTC)
MJD_LAST 52243.055 (2001-11-30 01:18:42.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 6.16e-13 ± 1.8e-14 erg cm-2 s-1

Hardness ratios
HR1
0.03 ± 0.02
0.2-0.5 / 0.5-1.0 keV
HR2
-0.05 ± 0.02
0.5-1.0 / 1.0-2.0 keV
HR3
-0.36 ± 0.02
1.0-2.0 / 2.0-4.5 keV
HR4
-0.60 ± 0.04
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -4.4) SUM_FLAG: 0
Long-term lightcurve

AGN

CLASSX outlier: 2.05

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
6526081
Match probability
0.999
FilterMag (AB)Err
UVW2 16.310 0.039
UVM2
UVW1 15.959 0.013
U
B
V

Spectroscopic (zsp) 1.05200
Photometric (TPZ) 1.0757 (conf 0.65)
Photometric (Le Phare) 0.7612 (conf 0.73)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 4.46e-13 (+4.6e-13 / −4.3e-13) erg cm−2 s−1
NH 4.83e+19 (+1.4e+20 / −1.7e+19) cm−2
Photon index (Γ) 2.12 (+2.17 / −2.08)
DoF 560
p-value 0.787
Quality flag 0

APPROX_SOURCE_VAR 11.400 (approximate flux variability amplitude)

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.