5XMM J172820.7-141454

5XMM-DR15 stacked source · SRCID 3004116010100034
Position: 17h28m20.75s -14d14m54.8s (262.08646°, -14.24857°)
EP flux
1.10e-15 ± 3.4e-16 erg cm-2 s-1
CLASSX
AGN (0.702)
Detections
13

SRCID 3004116010100034
IAUNAME 5XMM J172820.7-141454
SC_RA 17h28m20.75s (262.08646°)
SC_DEC -14d14m54.8s (-14.24857°)
RADEC_ERR 0.88 arcsec
LII / BII 10.4089° / 11.1693°
N_CONTRIB 13 (detections)
N_OBS 13 (observations covering the position)
MJD_FIRST 51966.410 (2001-02-26 09:50:20.000 UTC)
MJD_LAST 58751.667 (2019-09-25 16:00:27.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 1.10e-15 ± 3.4e-16 erg cm-2 s-1

Hardness ratios
HR1
0.72 ± 0.17
0.2-0.5 / 0.5-1.0 keV
HR2
0.06 ± 0.16
0.5-1.0 / 1.0-2.0 keV
HR3
-0.51 ± 0.17
1.0-2.0 / 2.0-4.5 keV
HR4
-0.56 ± 0.30
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -1.4) SUM_FLAG: 3
Long-term lightcurve

AGN

CLASSX outlier: 0.9

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
4670297
Match probability
0.811
FilterMag (AB)Err
UVW2 — —
UVM2 — —
UVW1 — —
U — —
B 18.827 0.042
V — —
Gaia DR3
Source ID
4137525103596482688
Match probability
0.273
Parallax
-2.161 ± 0.843 mas
Proper motion
(-5.23, -3.56) mas/yr
Magnitudes
G=20.48, BP=21.25, RP=19.76
CLASSOPT
Class
Star
Star
1.00
AGN
0.00
Galaxy
0.00

No redshift estimate available for this source.

Automated spectral fits are not yet available for this source. Interactive fitting on individual observations will be available from the contributing detections table soon.

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.