5XMM J163355.8+570923

5XMM-DR15 stacked source · SRCID 3004954010100004
Position: 16h33m55.85s +57d09m23.5s (248.48269°, 57.15653°)
EP flux
7.11e-14 ± 4.5e-15 erg cm-2 s-1
CLASSX
AGN (0.929)
Detections
6

SRCID 3004954010100004
IAUNAME 5XMM J163355.8+570923
SC_RA 16h33m55.85s (248.48269°)
SC_DEC +57d09m23.5s (57.15653°)
RADEC_ERR 0.24 arcsec
LII / BII 86.5750° / 40.9678°
N_CONTRIB 6 (detections)
N_OBS 6 (observations covering the position)
MJD_FIRST 52208.338 (2001-10-26 08:07:10.000 UTC)
MJD_LAST 53674.442 (2005-10-31 10:36:41.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 7.11e-14 ± 4.5e-15 erg cm-2 s-1

Hardness ratios
HR1
0.08 ± 0.04
0.2-0.5 / 0.5-1.0 keV
HR2
-0.01 ± 0.04
0.5-1.0 / 1.0-2.0 keV
HR3
-0.38 ± 0.04
1.0-2.0 / 2.0-4.5 keV
HR4
-0.67 ± 0.08
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -3.5) SUM_FLAG: 1
Long-term lightcurve

AGN

CLASSX outlier: 0.391

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
4237298
Match probability
0.999
FilterMag (AB)Err
UVW2 — —
UVM2 — —
UVW1 — —
U 20.146 0.030
B — —
V — —

Photometric (TPZ) 1.2257 (conf 0.79)
Photometric (Le Phare) 1.2900 (conf 0.92)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 7.42e-14 (+8.4e-14 / −6.6e-14) erg cm−2 s−1
NH 3.43e+19 (+1.3e+20 / −1.5e+19) cm−2
Photon index (Γ) 1.94 (+2.06 / −1.83)
DoF 494
p-value 0.548
Inter-instrument norm. 0.92 (0.82–1.04)
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.