5XMM J163403.0+570553

5XMM-DR15 stacked source · SRCID 3004954010100010
Position: 16h34m03.06s +57d05m53.7s (248.51275°, 57.09824°)
EP flux
3.26e-14 ± 3.2e-15 erg cm-2 s-1
CLASSX
AGN (0.531)
Detections
6

SRCID 3004954010100010
IAUNAME 5XMM J163403.0+570553
SC_RA 16h34m03.06s (248.51275°)
SC_DEC +57d05m53.7s (57.09824°)
RADEC_ERR 0.33 arcsec
LII / BII 86.4949° / 40.9654°
N_CONTRIB 6 (detections)
N_OBS 6 (observations covering the position)
MJD_FIRST 52208.338 (2001-10-26 08:07:10.000 UTC)
MJD_LAST 53674.442 (2005-10-31 10:36:41.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 3.26e-14 ± 3.2e-15 erg cm-2 s-1

Hardness ratios
HR1
0.24 ± 0.06
0.2-0.5 / 0.5-1.0 keV
HR2
0.09 ± 0.05
0.5-1.0 / 1.0-2.0 keV
HR3
-0.40 ± 0.06
1.0-2.0 / 2.0-4.5 keV
HR4
-0.80 ± 0.11
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML 12.3) SUM_FLAG: 0
Long-term lightcurve

AGN

CLASSX outlier: 1.43

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
4237957
Match probability
0.993
FilterMag (AB)Err
UVW2 — —
UVM2 — —
UVW1 — —
U 21.906 0.078
B — —
V — —

Photometric (TPZ) 0.5758 (conf 0.54)
Photometric (Le Phare) 0.5041 (conf 0.74)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 2.72e-14 (+3.3e-14 / −2.2e-14) erg cm−2 s−1
NH 3.01e+20 (+1.0e+21 / −3.1e+19) cm−2
Photon index (Γ) 2.02 (+2.39 / −1.80)
DoF 320
p-value 0.648
Inter-instrument norm. 0.95 (0.78–1.18)
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.