5XMM J163409.8+570351

5XMM-DR15 stacked source · SRCID 3004954010100023
Position: 16h34m09.89s +57d03m51.9s (248.54121°, 57.06440°)
EP flux
2.22e-14 ± 4.7e-15 erg cm-2 s-1
CLASSX
AGN (0.922)
Detections
6

SRCID 3004954010100023
IAUNAME 5XMM J163409.8+570351
SC_RA 16h34m09.89s (248.54121°)
SC_DEC +57d03m51.9s (57.06440°)
RADEC_ERR 0.47 arcsec
LII / BII 86.4465° / 40.9581°
N_CONTRIB 6 (detections)
N_OBS 6 (observations covering the position)
MJD_FIRST 52208.338 (2001-10-26 08:07:10.000 UTC)
MJD_LAST 53674.442 (2005-10-31 10:36:41.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 2.22e-14 ± 4.7e-15 erg cm-2 s-1

Hardness ratios
HR1
-0.01 ± 0.11
0.2-0.5 / 0.5-1.0 keV
HR2
0.09 ± 0.10
0.5-1.0 / 1.0-2.0 keV
HR3
-0.10 ± 0.10
1.0-2.0 / 2.0-4.5 keV
HR4
-0.47 ± 0.19
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -2.5) SUM_FLAG: 1
Long-term lightcurve

AGN

CLASSX outlier: -0.468

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
4238586
Match probability
0.997
FilterMag (AB)Err
UVW2 — —
UVM2 — —
UVW1 — —
U 22.610 0.170
B — —
V — —

Photometric (TPZ) 0.3759 (conf 0.29)
Photometric (Le Phare) 0.5247 (conf 0.34)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 2.86e-14 (+3.6e-14 / −2.2e-14) erg cm−2 s−1
NH 8.22e+19 (+3.9e+20 / −2.0e+19) cm−2
Photon index (Γ) 1.66 (+1.97 / −1.46)
DoF 312
p-value 0.244
Inter-instrument norm. 0.99 (0.77–1.25)
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.