5XMM J002707.7+170750

5XMM-DR15 stacked source · SRCID 3005014020100004
Position: 00h27m07.74s +17d07m50.1s (6.78224°, 17.13058°)
EP flux
2.35e-13 ± 1.3e-14 erg cm-2 s-1
CLASSX
AGN (0.731)
Detections
1

SRCID 3005014020100004
IAUNAME 5XMM J002707.7+170750
SC_RA 00h27m07.74s (6.78224°)
SC_DEC +17d07m50.1s (17.13058°)
RADEC_ERR 0.21 arcsec
LII / BII 114.6548° / -45.3501°
N_CONTRIB 1 (detections)
N_OBS 1 (observations covering the position)
MJD_FIRST 51915.674 (2001-01-06 16:10:21.000 UTC)
MJD_LAST 51916.277 (2001-01-07 06:39:29.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 2.35e-13 ± 1.3e-14 erg cm-2 s-1

Hardness ratios
HR1
0.39 ± 0.03
0.2-0.5 / 0.5-1.0 keV
HR2
0.15 ± 0.03
0.5-1.0 / 1.0-2.0 keV
HR3
-0.38 ± 0.03
1.0-2.0 / 2.0-4.5 keV
HR4
-0.25 ± 0.06
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -2.8) SUM_FLAG: 0
Long-term lightcurve

AGN

CLASSX outlier: 2.14

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
51880
Match probability
0.999
FilterMag (AB)Err
UVW2 21.466 0.179
UVM2 — —
UVW1 — —
U — —
B — —
V — —

Spectroscopic (zsp) 0.93000
Photometric (TPZ) 0.9757 (conf 0.50)
Photometric (Le Phare) 0.3607 (conf 0.74)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 1.74e-13 (+1.9e-13 / −1.6e-13) erg cm−2 s−1
NH 1.05e+21 (+1.4e+21 / −6.2e+20) cm−2
Photon index (Γ) 1.85 (+2.02 / −1.68)
DoF 367
p-value 0.864
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.