5XMM J112444.8+384116

5XMM-DR15 stacked source · SRCID 3005214020100004
Position: 11h24m44.82s +38d41m16.3s (171.18674°, 38.68787°)
EP flux
6.74e-14 ± 3.8e-15 erg cm-2 s-1
CLASSX
AGN (0.781)
Detections
2

SRCID 3005214020100004
IAUNAME 5XMM J112444.8+384116
SC_RA 11h24m44.82s (171.18674°)
SC_DEC +38d41m16.3s (38.68787°)
RADEC_ERR 0.21 arcsec
LII / BII 174.8911° / 68.5298°
N_CONTRIB 2 (detections)
N_OBS 2 (observations covering the position)
MJD_FIRST 52245.960 (2001-12-02 23:02:56.000 UTC)
MJD_LAST 60081.908 (2023-05-17 21:47:45.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 6.74e-14 ± 3.8e-15 erg cm-2 s-1

Hardness ratios
HR1
0.10 ± 0.03
0.2-0.5 / 0.5-1.0 keV
HR2
-0.12 ± 0.03
0.5-1.0 / 1.0-2.0 keV
HR3
-0.32 ± 0.04
1.0-2.0 / 2.0-4.5 keV
HR4
-0.44 ± 0.07
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -3.7) SUM_FLAG: 0
Long-term lightcurve

AGN

CLASSX outlier: 1.17

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
3046857
Match probability
0.999
FilterMag (AB)Err
UVW2 20.530 0.202
UVM2 — —
UVW1 20.315 0.112
U — —
B — —
V — —

Spectroscopic (zsp) 0.88000
Photometric (TPZ) 0.4259 (conf 0.21)
Photometric (Le Phare) 1.9970 (conf 0.83)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 3.61e-14 (+4.2e-14 / −3.2e-14) erg cm−2 s−1
NH 7.79e+19 (+2.9e+20 / −2.0e+19) cm−2
Photon index (Γ) 2.12 (+2.29 / −1.96)
DoF 389
p-value 0.298
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.