5XMM J105038.7+330207

5XMM-DR15 stacked source · SRCID 3005599020100058
Position: 10h50m38.72s +33d02m07.3s (162.66132°, 33.03537°)
EP flux
3.39e-14 ± 1.0e-14 erg cm-2 s-1
CLASSX
AGN (0.818)
Detections
1

SRCID 3005599020100058
IAUNAME 5XMM J105038.7+330207
SC_RA 10h50m38.72s (162.66132°)
SC_DEC +33d02m07.3s (33.03537°)
RADEC_ERR 0.78 arcsec
LII / BII 192.7742° / 63.3083°
N_CONTRIB 1 (detections)
N_OBS 3 (observations covering the position)
MJD_FIRST 52226.012 (2001-11-13 00:17:04.000 UTC)
MJD_LAST 52226.450 (2001-11-13 10:48:00.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 3.39e-14 ± 1.0e-14 erg cm-2 s-1

Hardness ratios
HR1
-0.05 ± 0.13
0.2-0.5 / 0.5-1.0 keV
HR2
0.01 ± 0.13
0.5-1.0 / 1.0-2.0 keV
HR3
-0.67 ± 0.14
1.0-2.0 / 2.0-4.5 keV
HR4
0.76 ± 0.15
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -2.2) SUM_FLAG: 0
Long-term lightcurve

AGN

CLASSX outlier: 0.729

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
2944602
Match probability
0.992
FilterMag (AB)Err
UVW2 — —
UVM2 — —
UVW1 21.703 0.250
U 21.198 0.165
B — —
V — —

Spectroscopic (zsp) 2.20200
Photometric (TPZ) 2.2254 (conf 0.97)
Photometric (Le Phare) 2.1770 (conf 0.85)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 3.93e-14 (+5.8e-14 / −2.4e-14) erg cm−2 s−1
NH 2.26e+20 (+1.5e+21 / −2.7e+19) cm−2
Photon index (Γ) 1.63 (+2.21 / −1.21)
DoF 230
p-value 0.344
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.