5XMM J104942.7+325637

5XMM-DR15 stacked source · SRCID 3005599020100118
Position: 10h49m42.75s +32d56m37.2s (162.42811°, 32.94366°)
EP flux
9.20e-15 ± 2.7e-15 erg cm-2 s-1
CLASSX
AGN (0.719)
Detections
1

SRCID 3005599020100118
IAUNAME 5XMM J104942.7+325637
SC_RA 10h49m42.75s (162.42811°)
SC_DEC +32d56m37.2s (32.94366°)
RADEC_ERR 1.17 arcsec
LII / BII 193.0116° / 63.1206°
N_CONTRIB 1 (detections)
N_OBS 3 (observations covering the position)
MJD_FIRST 52226.012 (2001-11-13 00:17:04.000 UTC)
MJD_LAST 52226.450 (2001-11-13 10:48:00.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 9.20e-15 ± 2.7e-15 erg cm-2 s-1

Hardness ratios
HR1
-0.16 ± 0.18
0.2-0.5 / 0.5-1.0 keV
HR2
0.23 ± 0.17
0.5-1.0 / 1.0-2.0 keV
HR3
-0.31 ± 0.24
1.0-2.0 / 2.0-4.5 keV
HR4
-0.66 ± 0.27
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -1.6) SUM_FLAG: 1
Long-term lightcurve

AGN

CLASSX outlier: 1.58

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
2941300
Match probability
0.978
FilterMag (AB)Err
UVW2 — —
UVM2 — —
UVW1 20.962 0.143
U 20.539 0.099
B — —
V 19.646 0.165

Spectroscopic (zsp) 1.92800
Photometric (TPZ) 1.7755 (conf 0.78)
Photometric (Le Phare) 1.6570 (conf 0.83)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Automated spectral fits are not yet available for this source. Interactive fitting on individual observations will be available from the contributing detections table soon.

APPROX_SOURCE_VAR 8.600 (approximate flux variability amplitude)

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.