5XMM J121832.8+471003

5XMM-DR15 stacked source · SRCID 3005914010100084
Position: 12h18m32.80s +47d10m03.0s (184.63665°, 47.16751°)
EP flux
1.50e-14 ± 3.3e-15 erg cm-2 s-1
CLASSX
AGN (0.937)
Detections
7

SRCID 3005914010100084
IAUNAME 5XMM J121832.8+471003
SC_RA 12h18m32.80s (184.63665°)
SC_DEC +47d10m03.0s (47.16751°)
RADEC_ERR 0.50 arcsec
LII / BII 138.6352° / 68.9453°
N_CONTRIB 7 (detections)
N_OBS 8 (observations covering the position)
MJD_FIRST 51886.934 (2000-12-08 22:25:31.000 UTC)
MJD_LAST 54057.366 (2006-11-18 08:47:36.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 1.50e-14 ± 3.3e-15 erg cm-2 s-1

Hardness ratios
HR1
0.14 ± 0.10
0.2-0.5 / 0.5-1.0 keV
HR2
-0.02 ± 0.10
0.5-1.0 / 1.0-2.0 keV
HR3
-0.27 ± 0.12
1.0-2.0 / 2.0-4.5 keV
HR4
-0.05 ± 0.21
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -2.3) SUM_FLAG: 1
Long-term lightcurve

AGN

CLASSX outlier: 0.247

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
3190144
Match probability
0.998
FilterMag (AB)Err
UVW2 — —
UVM2 — —
UVW1 22.577 0.139
U — —
B — —
V — —

Photometric (TPZ) 0.2259 (conf 0.54)
Photometric (Le Phare) 1.0660 (conf 0.60)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 1.53e-14 (+2.2e-14 / −1.1e-14) erg cm−2 s−1
NH 7.25e+19 (+3.6e+20 / −1.8e+19) cm−2
Photon index (Γ) 1.85 (+2.22 / −1.55)
DoF 247
p-value 0.473
Inter-instrument norm. 0.70 (0.56–0.94)
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.