5XMM J124904.0-060158

5XMM-DR15 stacked source · SRCID 3006037020100015
Position: 12h49m04.00s -06d01m58.3s (192.26667°, -6.03285°)
EP flux
5.34e-14 ± 3.1e-15 erg cm-2 s-1
CLASSX
AGN (0.747)
Detections
3

SRCID 3006037020100015
IAUNAME 5XMM J124904.0-060158
SC_RA 12h49m04.00s (192.26667°)
SC_DEC -06d01m58.3s (-6.03285°)
RADEC_ERR 0.22 arcsec
LII / BII 301.8543° / 56.8339°
N_CONTRIB 3 (detections)
N_OBS 12 (observations covering the position)
MJD_FIRST 52101.640 (2001-07-11 15:22:08.000 UTC)
MJD_LAST 53201.820 (2004-07-15 19:41:14.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 5.34e-14 ± 3.1e-15 erg cm-2 s-1

Hardness ratios
HR1
0.22 ± 0.04
0.2-0.5 / 0.5-1.0 keV
HR2
-0.03 ± 0.04
0.5-1.0 / 1.0-2.0 keV
HR3
-0.33 ± 0.04
1.0-2.0 / 2.0-4.5 keV
HR4
-0.50 ± 0.07
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -3.5) SUM_FLAG: 0
Long-term lightcurve

AGN

CLASSX outlier: 1.04

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
3302962
Match probability
0.999
FilterMag (AB)Err
UVW2 — —
UVM2 — —
UVW1 21.526 0.044
U — —
B — —
V — —

Photometric (TPZ) 0.6758 (conf 0.73)
Photometric (Le Phare) 0.7949 (conf 0.89)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 5.12e-14 (+5.6e-14 / −4.6e-14) erg cm−2 s−1
NH 1.35e+20 (+4.1e+20 / −2.7e+19) cm−2
Photon index (Γ) 1.85 (+1.98 / −1.76)
DoF 597
p-value 0.991
Inter-instrument norm. 0.98 (0.89–1.09)
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.