5XMM J124914.8-060031

5XMM-DR15 stacked source · SRCID 3006037020100017
Position: 12h49m14.80s -06d00m31.9s (192.31169°, -6.00886°)
EP flux
5.01e-14 ± 2.9e-15 erg cm-2 s-1
CLASSX
AGN (0.884)
Detections
3

SRCID 3006037020100017
IAUNAME 5XMM J124914.8-060031
SC_RA 12h49m14.80s (192.31169°)
SC_DEC -06d00m31.9s (-6.00886°)
RADEC_ERR 0.23 arcsec
LII / BII 301.9354° / 56.8586°
N_CONTRIB 3 (detections)
N_OBS 12 (observations covering the position)
MJD_FIRST 52101.640 (2001-07-11 15:22:08.000 UTC)
MJD_LAST 53201.820 (2004-07-15 19:41:14.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 5.01e-14 ± 2.9e-15 erg cm-2 s-1

Hardness ratios
HR1
0.33 ± 0.04
0.2-0.5 / 0.5-1.0 keV
HR2
0.08 ± 0.04
0.5-1.0 / 1.0-2.0 keV
HR3
-0.24 ± 0.04
1.0-2.0 / 2.0-4.5 keV
HR4
-0.57 ± 0.06
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -3.4) SUM_FLAG: 0
Long-term lightcurve

AGN

CLASSX outlier: -0.35

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
3304333
Match probability
0.999
FilterMag (AB)Err
UVW2 — —
UVM2 — —
UVW1 22.390 0.136
U — —
B — —
V — —

Photometric (TPZ) 1.0757 (conf 0.36)
Photometric (Le Phare) 1.1300 (conf 0.95)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 6.12e-14 (+6.6e-14 / −5.6e-14) erg cm−2 s−1
NH 6.31e+20 (+9.5e+20 / −3.1e+20) cm−2
Photon index (Γ) 1.76 (+1.87 / −1.62)
DoF 636
p-value 0.991
Inter-instrument norm. 0.95 (0.86–1.04)
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.