5XMM J162909.6+780441

5XMM-DR15 stacked source · SRCID 3006194030100002
Position: 16h29m09.64s +78d04m41.1s (247.29016°, 78.07807°)
EP flux
4.10e-13 ± 1.9e-14 erg cm-2 s-1
CLASSX
AGN (0.561)
Detections
4

SRCID 3006194030100002
IAUNAME 5XMM J162909.6+780441
SC_RA 16h29m09.64s (247.29016°)
SC_DEC +78d04m41.1s (78.07807°)
RADEC_ERR 0.18 arcsec
LII / BII 111.2960° / 33.5795°
N_CONTRIB 4 (detections)
N_OBS 4 (observations covering the position)
MJD_FIRST 52172.089 (2001-09-20 02:08:03.000 UTC)
MJD_LAST 54149.036 (2007-02-18 00:51:46.000 UTC)

Stacked EPIC flux

EP flux (0.2-12 keV): 4.10e-13 ± 1.9e-14 erg cm-2 s-1

Hardness ratios
HR1
-0.44 ± 0.02
0.2-0.5 / 0.5-1.0 keV
HR2
-0.33 ± 0.03
0.5-1.0 / 1.0-2.0 keV
HR3
-0.63 ± 0.05
1.0-2.0 / 2.0-4.5 keV
HR4
-0.73 ± 0.18
2.0-4.5 / 4.5-12.0 keV
Extent: 0.00 arcsec (ML -4.2) SUM_FLAG: 0
Long-term lightcurve

AGN

CLASSX outlier: 0.0326

Class probabilities
Class taxonomy
  • AGN — active galactic nucleus.
  • Bkg_AGN — background AGN.
  • Star — Galactic star.
  • Gal_XRB — Galactic X-ray binary.
  • Extragal_XRB — extragalactic X-ray binary.
  • CV — cataclysmic variable.
  • Extended — cluster or galaxy.

Optical Monitor (OM)
OM Source ID
4197799
Match probability
0.998
FilterMag (AB)Err
UVW2 11.670 0.004
UVM2 — —
UVW1 — —
U — —
B — —
V — —

Photometric (TPZ) 1.7755 (conf 0.36)
Photometric (Le Phare) 0.0814 (conf 1.00)

Spectroscopic redshifts (when present) are the most reliable. Photometric estimates carry a per-algorithm confidence flag.

Stacked power-law fit
Unabsorbed flux 2.39e-13 (+2.7e-13 / −2.2e-13) erg cm−2 s−1
NH 7.07e+20 (+1.0e+21 / −2.8e+20) cm−2
Photon index (Γ) 2.66 (+2.87 / −2.38)
DoF 1291
p-value 0.013
Inter-instrument norm. 1.05 (0.97–1.16)
Quality flag 0

No variability data available for this source.

No contributing observations found.

Sky view (optical)

DSS2 colour optical image. The header thumbnail shows the XMM-Newton X-ray image; use the layers menu in the toolbar to switch surveys.

Hardness-ratio diagram

The per-observation light curve is shown in the X-ray properties section above.